The TS3000-SE is the consequent further development of the TS3000 probe system equipped with MPI ShielDEnvironment™ for ultra-low noise, extremely accurate and highly reliable DC/CV, 1/f, RTS and RF measurements, addressing primarily the needs of the Device Characterization , Wafer Level Reliability and RF & mmW applications. The exclusive, actively cooled probe platen design provides maximal stability over the wide temperature range from -60° to 300°C and is making the TS3000-SE probe system an excellent choice for testing devices under different thermal conditions. It incorporates MPI advanced technologies, such as PHC™ , as a standard feature, and mDrive™ and/or VCE™ optional or as an upgrade in the field.