Features & Benefits

Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.​ 

Auriga PIV System - 220V Configuration 

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