TS150
150mm Manual Probe System
For accurate and reliable DC/CV, RF and High Power measurements
6 inch
180 x 230 mm (7.1 x 9.1inch)
< 10 µm
360°
Puck controlled air bearing stage
Universal Use
• Designed for wide variety of applications such as Device Characterization and Modeling, Wafer Level Reliability, Failure Analysis, IC Engineering, MEMS and High Power
Ergonomic Design
• Unique puck controlled air bearing stage for quick single-handed operation
• Rigid platen accommodates up to 10 DC or 4 RF positioners
• Highly repeatable platen lift design with three discrete positions for contact, separation, and loading
Upgradability
• Available with various chuck options and wide range of accessories such as DC/RF/mmW MicroPositioners, Optics, microscopes and
EMI shielded dark box to support various application requirements