Focus MPIV 200V
Empower your semiconductor device characterization with MPIV. Ideal for high power current and voltage measurements, it offers precise pulsing capabilities with adjustable parameters and customizable solutions for your specific needs.

Features & Benefits
The MPIV – Modular Pulsed IV is used for
High Power current & voltage characterization of semiconductor devices. It
is also well suited for applications requiring precise high current and voltage
pulses. The Drain Pulse Module (DPM) uses an external high-current supply while
the Gate Pulse Module (GPM) has an internal high-precision voltage supply.
Additionally, the MPIV can be synchronized with an external or internal
trigger.
The DPM is the core of the system. Its
internal microcontroller uses precision Pulse Width Modulation (PWM) modules
with complementary outputs and programmable dead-time in order to generate and
synchronize the pulses for both drain and gate bias. The pulse width is
adjustable from 200ns to 2ms; pulse repetition rate from 500Hz to 1MHz, with a
maximum duty cycle of 50%. Two internal N-channel MOSFETs within the drain
module support voltages up to 200V and currents up to 17A. Both the pulse and
quiescent bias voltages are delivered via external DC power supplies thereby making the Modular Pulsed IV a customizable solution.
Setup
The GPM operates as a slave module
controlled by the DPM. Internal precision Digital Analog Converters (DAC) are
used to adjust the gate voltage in the range of ±10V, with a 5mV resolution.
The output buffer amplifier delivers up to 100mA.
Voltage and current measurements are performed using a high speed 4-channel digital oscilloscope. Voltages are sampled directly on the gate and drain bias-tee sense terminals; the drain current is measured using a high-speed high sensitivity current probe.
