Designed for Silicon Photonics Device Testing 

• Dual sided device testing, top & bottom 

• Supports O-O, E-O, O-E, E-E device types 

• Integrated Z-distance calibration guarantees accurate probe to device distance 

• Temperature device cycling from ambient to +150°C

Optical Setup 

• Hexapod+NanoPositioner combination, for high precision and ultra-fast fiber probe alignment 

• Grating and Edge fiber probe coupling 

• East and West configurations 

• Double sided, top & bottom 

Electrical Setup 

• Probe card in 4.5 inch width format 

• DC and RF MicroPositioners 

• Single sided, top 

• Optional high-pin count support, up to 35kg force 

Ergonomic Design and Footprint 

• Easy wafer or single DUT loading from the front 

• Integrated active vibration isolation 

• Intelligent integrated prober control, for fast and accurate operation 

• Optional test instrumentation shelf enables short cable routing, supporting high frequency applications