BRAND

1/11

TS50

50 mm Manual Probe System
For accurate and reliable DC/CV and RF measurements

  • Wafer size

    2 inch

  • Total travel range

    100 x 75 mm (3.9 x 3.0 in)

  • Planarity

    < 10 µm

  • Theta travel

    360°

  • Movement

    Guided rail with instant lock mechanism

Flexible Platform

• Designed for research, development and academic use in IC engineering, single die probing 

• Ideal platform for load pull and high frequency noise measurement

 

Ergonomic Design  

• Solid and stable platform in small footprint (300 x 300 mm) design

• Rigid platen accommodates up to 6 DC or 2 RF positioners 

• Simple operation for stage and microscope positioning

 

Upgradability  

• Available with various chuck options and wide range of accessories such as DC/RF/mmW MicroPositioners, Optics, microscopes and 

EMI shielded dark box to support various application requirements