TS50
50 mm Manual Probe System
For accurate and reliable DC/CV and RF measurements
2 inch
100 x 75 mm (3.9 x 3.0 in)
< 10 µm
360°
Guided rail with instant lock mechanism
Flexible Platform
• Designed for research, development and academic use in IC engineering, single die probing
• Ideal platform for load pull and high frequency noise measurement
Ergonomic Design
• Solid and stable platform in small footprint (300 x 300 mm) design
• Rigid platen accommodates up to 6 DC or 2 RF positioners
• Simple operation for stage and microscope positioning
Upgradability
• Available with various chuck options and wide range of accessories such as DC/RF/mmW MicroPositioners, Optics, microscopes and
EMI shielded dark box to support various application requirements